IEEE - Institute of Electrical and Electronics Engineers, Inc. - A comparative analysis of event tupling schemes

Proceedings of Annual Symposium on Fault Tolerant Computing

Author(s): Buckley, M.F. ; Siewiorek, D.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Sendai, Japan, Japan
Conference Date: 25 June 1996
Page(s): 294 - 303
ISBN (Paper): 0-8186-7262-5
ISSN (Paper): 0731-3071
DOI: 10.1109/FTCS.1996.534614
Regular:

Event logs provide an effective means of improving system availability. However, the majority of faults produce many errors because faults propagate in the time and error detection domains. Thus,... View More

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