IEEE - Institute of Electrical and Electronics Engineers, Inc. - Symbol error correcting codes for memory applications

Proceedings of Annual Symposium on Fault Tolerant Computing

Author(s): Chen, C.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Sendai, Japan, Japan
Conference Date: 25 June 1996
Page(s): 200 - 207
ISBN (Paper): 0-8186-7262-5
ISSN (Paper): 0731-3071
DOI: 10.1109/FTCS.1996.534607
Regular:

Symbol error correcting codes have been used for fault tolerance in computer memory subsystems configured in b-bits-per-chip. This paper presents algorithms for designing the parity check matrices... View More

Advertisement