IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multiple fault diagnosis in sequential circuits using sensitizing sequence pairs

Proceedings of Annual Symposium on Fault Tolerant Computing

Author(s): Yanagida, N. ; Takahashi, H. ; Takamatsu, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Sendai, Japan, Japan
Conference Date: 25 June 1996
Page(s): 86 - 95
ISBN (Paper): 0-8186-7262-5
ISSN (Paper): 0731-3071
DOI: 10.1109/FTCS.1996.534597
Regular:

The paper presents an approach to multiple fault diagnosis in sequential circuits by using input sequence pairs having sensitizing input pairs. This represents an extension of our previous work... View More

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