IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic test compaction for synchronous sequential circuits using static compaction techniques

Proceedings of Annual Symposium on Fault Tolerant Computing

Author(s): Pomeranz, I. ; Reddy, S.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Sendai, Japan, Japan
Conference Date: 25 June 1996
Page(s): 53 - 61
ISBN (Paper): 0-8186-7262-5
ISSN (Paper): 0731-3071
DOI: 10.1109/FTCS.1996.534594
Regular:

Short test sequences for synchronous sequential circuits are important in reducing test application time and memory requirements. In addition, dynamic test compaction, where heuristics to generate... View More

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