IEEE - Institute of Electrical and Electronics Engineers, Inc. - Functional testability measures based on information flow

Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996

Author(s): Yulong Shao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Dayton, OH, USA
Conference Date: 20 May 1996
Volume: 1
ISBN (Paper): 0-7803-3306-3
ISSN (Paper): 0547-3578
DOI: 10.1109/NAECON.1996.518052
Regular:

To measure testability of circuits precisely is one of the important problems in digital system testing. This paper presents a method based on information flow to measure the testability of... View More

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