IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic target recognition using higher order neural network

Proceedings of the IEEE 1996 National Aerospace and Electronics Conference NAECON 1996

Author(s): Liqing Wan ; Longhe Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Dayton, OH, USA
Conference Date: 20 May 1996
Volume: 1
ISBN (Paper): 0-7803-3306-3
ISSN (Paper): 0547-3578
DOI: 10.1109/NAECON.1996.517646
Regular:

Translational rotational scaling invariant (TRSI) pattern recognition is an important problem in the automatic target recognition (ATR) field. Recent research has shown that the higher order... View More

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