IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting equivalent mutants and the feasible path problem

Proceedings of 11th Annual Conference on Computer Assurance. COMPASS '96

Author(s): Offutt, A.J. ; Jie Pan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Gaithersburg, MD, USA, USA
Conference Date: 17 June 1996
Page(s): 224 - 236
ISBN (Paper): 0-7803-3390-X
DOI: 10.1109/CMPASS.1996.507890
Regular:

Mutation testing is a technique for testing software units that has great potential for improving the quality of testing, and thereby increasing our ability to assure the high reliability of... View More

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