IEEE - Institute of Electrical and Electronics Engineers, Inc. - Indexing to 3D model aspects using 2D contour features

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): Jin-Long Chen ; G.C. Stockman
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 8
Page(s): 913 - 920
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517180
Regular:

We present a shape-based method of indexing to model aspects from a single intensity image. Objects are assumed to be rigid. A model aspect is represented by a 2 1/2 D edgemap and the parts of the... View More

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