IEEE - Institute of Electrical and Electronics Engineers, Inc. - Combining greyvalue invariants with local constraints for object recognition

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): C. Schmid ; R. Mohr
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 872 - 877
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517174
Regular:

This paper addresses the problem of recognizing objects in large image databases. The method is based on local characteristics which are invariant to similarity transformations in the image. These... View More

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