IEEE - Institute of Electrical and Electronics Engineers, Inc. - Closest point search in high dimensions

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): S.A. Nene ; S.K. Nayar
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 7
Page(s): 859 - 865
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517172
Regular:

The problem of finding the closest point in high-dimensional spaces is common in computational vision. Unfortunately, the complexity of most existing search algorithms, such as k-d tree and... View More

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