IEEE - Institute of Electrical and Electronics Engineers, Inc. - Global minimum for active contour models: a minimal path approach

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): L.D. Cohen ; R. Kimmel
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 8
Page(s): 666 - 673
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517144
Regular:

A new boundary detection approach for shape modeling is presented. It detects the global minimum of an active contour model's energy between two points. Initialization is made easier and the curve... View More

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