IEEE - Institute of Electrical and Electronics Engineers, Inc. - Bayesian face recognition using deformable intensity surfaces

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): B. Moghaddam ; C. Nastar ; A. Pentland
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 8
Page(s): 638 - 645
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517140
Regular:

We describe a novel technique for face recognition based on deformable intensity surfaces which incorporates both the shape and texture components of the 2D image. The intensity surface of the... View More

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