IEEE - Institute of Electrical and Electronics Engineers, Inc. - Competitive mixture of deformable models for pattern classification

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): Kwok-Wai Cheung ; Dit-Yan Yeung ; R.T. Chin
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 613 - 618
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517136
Regular:

Following the success of applying deformable models to feature extraction, a natural next step is to apply such models to pattern classification. Recently, we have cast a deformable model under a... View More

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