IEEE - Institute of Electrical and Electronics Engineers, Inc. - Constrained phase congruency: simultaneous detection of interest points and of their scales

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): D. Reisfeld
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 562 - 567
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517128
Regular:

A novel feature detector-the Constrained Phase Congruency Transform (CPCT) is introduced. It simultaneously detects interest points as well as their scale in various orientations. The CPCT is... View More

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