IEEE - Institute of Electrical and Electronics Engineers, Inc. - Affine invariant detection: edges, active contours, and segments

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): P.J. Olver ; G. Sapiro ; A. Tannenbaum
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 520 - 525
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517121
Regular:

In this paper we undertake a systematic investigation of affine invariant object detection. Edge detection is first presented from the point of view of the affine invariant scale-space obtained by... View More

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