IEEE - Institute of Electrical and Electronics Engineers, Inc. - Parametric feature detection

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): S.K. Nayar ; S. Baker ; H. Murase
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 7
Page(s): 471 - 477
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517114
Regular:

We propose an algorithm to automatically construct feature detectors for arbitrary parametric features. To obtain a high level of robustness we advocate the use of realistic multi-parameter... View More

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