IEEE - Institute of Electrical and Electronics Engineers, Inc. - Edge detection and ridge detection with automatic scale selection

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): T. Lindeberg
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 465 - 470
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517113
Regular:

When extracting features from image data, the type of information that can be extracted may be strongly dependent on the scales at which the feature detectors are applied. This article presents a... View More

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