IEEE - Institute of Electrical and Electronics Engineers, Inc. - Combination of multiple classifiers using local accuracy estimates

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): K. Woods ; K. Bowyer ; W.P. Kegelmeyer, Jr.
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 391 - 396
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517102
Regular:

Combination of multiple classifiers (CMC) has recently drawn attention as a method of improving classification accuracy. This paper presents a method for combining classifiers that use estimates... View More

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