IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ordinal measures for visual correspondence

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): D.N. Bhat ; S.K. Nayar
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 7
Page(s): 351 - 357
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517096
Regular:

We present ordinal measures for establishing image correspondence. Linear correspondence measures like correlation and the sum of squared differences are known to be fragile. Ordinal measures,... View More

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