IEEE - Institute of Electrical and Electronics Engineers, Inc. - Comparison of edge detectors: a methodology and initial study

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): M. Heath ; S. Sarkar ; T. Sanocki ; K. Bowyer
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 143 - 148
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517066
Regular:

The purpose of this paper is to describe a new (to computer vision) experimental framework which allows us to make quantitative comparisons using subjective ratings made by people. This approach... View More

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