IEEE - Institute of Electrical and Electronics Engineers, Inc. - Polarization phase-based method for material classification and object recognition in computer vision

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): Hua Chen ; L.B. Wolff
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 8
Page(s): 128 - 135
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517064
Regular:

A robust and accurate polarization phase-based technique for material classification is presented. The novelty of this technique is three-fold In (i) its theoretical development, (ii) its... View More

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