IEEE - Institute of Electrical and Electronics Engineers, Inc. - Modeling clutter and context for target detection in infrared images

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): S. Rong ; B. Bhanu
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 8
Page(s): 106 - 113
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517061
Regular:

In order to reduce false alarms and to improve the target detection performance of an automatic target detection and recognition system operating in a cluttered environment, it is important to... View More

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