IEEE - Institute of Electrical and Electronics Engineers, Inc. - Finding corresponding points based on Bayesian triangulation

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): A.S. Bedekar ; R.M. Haralick
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 6
Page(s): 61 - 66
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517054
Regular:

In this paper, we consider the problems of finding corresponding points from multiple perspective projection images (the correspondence problem), and estimating the 3-D point from which these... View More

Advertisement