IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scale space localization, blur, and contour-based image coding

Proceedings of IEEE Conference on Computer Vision and Pattern Recognition

Author(s): J.H. Elder ; S.W. Zucker
Sponsor(s): IEEE Comput. Soc. Tech. Committee on Pattern Analysis & Machine Intelligence
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 18 June 1996
Page Count: 8
Page(s): 27 - 34
ISBN (Paper): 0-8186-7259-5
ISSN (Paper): 1063-6919
DOI: 10.1109/CVPR.1996.517049
Regular:

We have recently proposed a scale-adaptive algorithm for reliable edge detection and blur estimation. The algorithm produces a contour code which consists of estimates of position, brightness,... View More

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