IEEE - Institute of Electrical and Electronics Engineers, Inc. - A novel MMIC source impedance tuner for on-wafer microwave noise parameter measurements

IEEE 1996 Microwave and Millimeter-Wave Monolithic Circuits Symposium. Digest of Papers

Author(s): Collins, C.E. ; Pollard, R.D. ; Miles, R.E.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Francisco, CA, USA, USA
Conference Date: 17 June 1996
Page(s): 123 - 126
ISBN (Paper): 0-7803-3360-8
DOI: 10.1109/MCS.1996.506318
Regular:

A novel GaAs HEMT MMIC source impedance tuner is reported which can be incorporated into a wafer probe tip. This eliminates the effect of cable and probe losses on reflection coefficient, which... View More

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