IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improved multiple look technique

IGARSS '96. 1996 International Geoscience and Remote Sensing Symposium

Author(s): Yeo, T.S. ; Lay, W.L. ; Lu, Y.H. ; Ng, W.E. ; Lim, I. ; Zhang, C.B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Lincoln, NE, USA, USA
Conference Date: 31 May 1996
Volume: 1
ISBN (Paper): 0-7803-3068-4
DOI: 10.1109/IGARSS.1996.516243
Regular:

Synthetic aperture radar (SAR) images are contaminated by speckle noise. To suppress speckle, N lower resolution images (looks) are generated and averaged. This improves the signal-to-speckle... View More

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