IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of one-vector testable binary systems based on ternary logic

Proceedings of 26th IEEE International Symposium on Multiple-Valued Logic (ISMVL'96)

Author(s): Mou Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: Santiago de Compostela, Spain, Spain
Conference Date: 29 May 1996
Page(s): 62 - 66
ISBN (Paper): 0-8186-7392-3
ISSN (Paper): 0195-623X
DOI: 10.1109/ISMVL.1996.508337
Regular:

A new concept, one-vector testability, is defined. Design method to achieve one-vector testability of binary systems based on ternary logic is proposed. Some techniques for designing testable... View More

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