IEEE - Institute of Electrical and Electronics Engineers, Inc. - IDDQ testing in low power supply CMOS circuits

Proceedings of Custom Integrated Circuits Conference

Author(s): Tong, C.Q. ; Wen, M. ; Shyang-Tai Su
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Diego, CA, USA, USA
Conference Date: 5 May 1996
Page(s): 467 - 470
ISBN (Paper): 0-7803-3117-6
DOI: 10.1109/CICC.1996.510598
Regular:

The I/sub DDQ/ current testing for low power circuits is investigated. Two examples of low power circuits are considered. One involves strictly a decrease in supply voltage, the other reduces... View More

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