IEEE - Institute of Electrical and Electronics Engineers, Inc. - An EEPROM compact circuit model

Proceedings of Custom Integrated Circuits Conference

Author(s): Klein, P. ; Hoffmann, K. ; Kowarik, O.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1996
Conference Location: San Diego, CA, USA, USA
Conference Date: 5 May 1996
Page(s): 325 - 328
ISBN (Paper): 0-7803-3117-6
DOI: 10.1109/CICC.1996.510568
Regular:

The model allows the simulation of threshold voltage and drain current shifts as well as FN-tunnel and substrate currents caused by FN and band-to-band tunneling. This is achieved by determining... View More

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