IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pathlengths of SPEC benchmarks for PA-RISC, MIPS, and SPARC

COMPCON Spring '93. Digest of Papers

Author(s): McMahan, L. ; Lee, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 22 February 1993
Page(s): 481 - 490
ISBN (Paper): 0-8186-3400-6
DOI: 10.1109/CMPCON.1993.289718
Regular:

The total instruction pathlength and instruction frequency counts are measured for the SPEC89 benchmark programs on the PA-RISC architecture and compared with previously published information for... View More

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