IEEE - Institute of Electrical and Electronics Engineers, Inc. - Xtmap: generate-and-test mapper for table-lookup gate arrays

COMPCON Spring '93. Digest of Papers

Author(s): Karplus, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 22 February 1993
Page(s): 391 - 399
ISBN (Paper): 0-8186-3400-6
DOI: 10.1109/CMPCON.1993.289703
Regular:

Introduces Xtmap, a technology mapper for f-input table-lookup cells based on a generate-and-test paradigm. Xtmap can optimize for area and delay simultaneously and produces smaller circuits than... View More

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