IEEE - Institute of Electrical and Electronics Engineers, Inc. - Autonomous fault masking processor

COMPCON Spring '93. Digest of Papers

Author(s): Mori, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Francisco, CA, USA, USA
Conference Date: 22 February 1993
Page(s): 258 - 263
ISBN (Paper): 0-8186-3400-6
DOI: 10.1109/CMPCON.1993.289675
Regular:

The author describes the architecture of fault tolerant processors. It features fault masking by majority voting, based on the cell's reliability. Each node cell must consist of two operation... View More

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