IEEE - Institute of Electrical and Electronics Engineers, Inc. - A repairable and diagnosable cellular array on multiple-valued logic

Proceedings of 1993 IEEE International Symposium on Multiple Valued Logic (ISMVL '93)

Author(s): Kamiura, N. ; Hata, Y. ; Yamato, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Sacramento, CA, USA
Conference Date: 24 May 1993
Page(s): 92 - 97
ISBN (Paper): 0-8186-3350-6
DOI: 10.1109/ISMVL.1993.289575
Regular:

A diagnosable and repairable k-valued cellular array is proposed, assuming a single fault, i.e., either a stuck-at-0 fault or a stuck-at-(k-1) fault of switches, occurs in the array. By building... View More

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