IEEE - Institute of Electrical and Electronics Engineers, Inc. - The application of artificial neural networks to quality control charts

Author(s): Kopcso, D. ; Pipino, L. ; Rybolt, W.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Wailea, HI, USA
Conference Date: 8 January 1993
Volume: iv
ISBN (Paper): 0-8186-3230-5
DOI: 10.1109/HICSS.1993.284241
Regular:

Reports on the development of artificial neural networks that function as alternatives to conventional quality control charts. Multilayered feedforward networks using a backpropagation learning... View More

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