IEEE - Institute of Electrical and Electronics Engineers, Inc. - A repetitive fault tolerance model for parallel programs

Author(s): Yen, I.-L. ; Leiss, E.L. ; Bastani, F.B.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Wailea, HI, USA
Conference Date: 8 January 1993
Volume: ii
ISBN (Paper): 0-8186-3230-5
DOI: 10.1109/HICSS.1993.284081
Regular:

The authors propose a repetitive fault tolerance (RFT) model, which provides an environment for the systematic development of fault tolerant parallel programs. RFT programs can tolerate processor... View More

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