IEEE - Institute of Electrical and Electronics Engineers, Inc. - IDDQ test results on a digital CMOS ASIC

Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93

Author(s): Schiessler, G. ; Spivak, C. ; Davidson, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Diego, CA, USA
Conference Date: 9 May 1993
ISBN (Paper): 0-7803-0826-3
DOI: 10.1109/CICC.1993.590781
Regular:

The test program of a digital CMOS ASIC (application-specific integrated circuit) was instrumented for IDDQ current measurement. The design test included a low-fault-coverage functional set... View More

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