IEEE - Institute of Electrical and Electronics Engineers, Inc. - Effect of voltage ramping for time-of-flight bunching on light ion beam transport efficiency

International Conference on Plasma Sciences (ICOPS)

Author(s): Ottinger, P.F. ; Rose, D.V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Vancouver, BC, Canada, Canada
Conference Date: 7 June 1993
ISBN (Paper): 0-7803-1360-7
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.1993.593560
Regular:

Summary form only given. The Laboratory Microfusion Facility (LMF) has been proposed for the study of high-gain, high-yield inertial confinement fusion targets. Bunching factors of /spl alpha/ =... View More

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