IEEE - Institute of Electrical and Electronics Engineers, Inc. - Merging multiple FSM controllers for DFT/BIST hardware

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD)

Author(s): Mukherjee, D. ; Pedram, M. ; Breuer, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 7 November 1993
Page(s): 720 - 725
ISBN (Paper): 0-8186-4490-7
DOI: 10.1109/ICCAD.1993.580168
Regular:

Multiple test controllers are often required to control test plans corresponding to various testable design methodologies embedded in a circuit. Implementing these controllers as independent... View More

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