IEEE - Institute of Electrical and Electronics Engineers, Inc. - Boolean matching for full-custom ECL gates

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD)

Author(s): Mayo, R.N. ; Touati, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 7 November 1993
Page(s): 472 - 477
ISBN (Paper): 0-8186-4490-7
DOI: 10.1109/ICCAD.1993.580100
Regular:

We present a technology mapper for full-custom ECL gates. These gates are characterized by high fanins and a regular structure. Full-custom gates differ from ECL library gates in that a full range... View More

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