IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test generation for multiple faults based on parallel vector pair analysis

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD)

Author(s): Kajihara, S. ; Sumioka, T. ; Kinoshita, K.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 7 November 1993
Page(s): 436 - 439
ISBN (Paper): 0-8186-4490-7
DOI: 10.1109/ICCAD.1993.580093
Regular:

This paper presents a method for generating test sets to detect multiple stuck-at faults in combinational circuits. The proposed method is based on parallel vector pair analysis which finds faulty... View More

Advertisement