IEEE - Institute of Electrical and Electronics Engineers, Inc. - A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD)

Author(s): Michael, C. ; Abel, C. ; Teng, C.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 7 November 1993
Page(s): 330 - 333
ISBN (Paper): 0-8186-4490-7
DOI: 10.1109/ICCAD.1993.580077
Regular:

A new statistical MOS model has been developed for computer-aided design of submicrometer analog integrated circuits. This model accounts for both parameter mismatch and inter-die parameter... View More

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