IEEE - Institute of Electrical and Electronics Engineers, Inc. - STYLE: A technology-independent approach to statistical design

Proceedings of 1993 International Conference on Computer Aided Design (ICCAD)

Author(s): Chen, J. ; Yang, A.T.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Santa Clara, CA, USA, USA
Conference Date: 7 November 1993
Page(s): 210 - 214
ISBN (Paper): 0-8186-4490-7
DOI: 10.1109/ICCAD.1993.580058
Regular:

Despite their indisputable benefits, parametric yield prediction/optimization techniques are often not routinely used by industry because of prohibitive costs and/or lack of generality. To... View More

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