IEEE - Institute of Electrical and Electronics Engineers, Inc. - Parameter extraction for large signal noise models and simulation of noise in large signal circuits like mixers and oscillators

Author(s): Rohde, Ulrich L. ; Chang, Chao-Ren ; Gerber, Jason ; Pengelly, Raymond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 1993
Conference Location: Madrid, Spain, Spain
Conference Date: 6 September 1993
Page(s): 465 - 470
DOI: 10.1109/EUMA.1993.336597
Regular:

This paper shows how to obtain an equivalent circuit model for bipolar transistors and FEITs to generate a bias-dependent model. The bias-dependent model is required as a seed to obtain starting... View More

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