IEEE - Institute of Electrical and Electronics Engineers, Inc. - AEGIS ORTS - The first and future ultimate integrated diagnostic system

AUTOTESTCON 93

Author(s): Brazet, M.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Antonio, TX, USA, USA
Conference Date: 20 September 1993
Page(s): 377 - 382
ISBN (Paper): 0-7803-0646-5
DOI: 10.1109/AUTEST.1993.396331
Regular:

This paper discusses the implementation of a structured built-in-test system designed over 20 years ago to support availability of the AEGIS Weapon System. Many of the techniques and concepts... View More

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