IEEE - Institute of Electrical and Electronics Engineers, Inc. - Embedded diagnostic system design using an automated diagnostic tool set

AUTOTESTCON 93

Author(s): Granieri, M.N. ; Levy, F.J.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: San Antonio, TX, USA, USA
Conference Date: 20 September 1993
Page(s): 645 - 649
ISBN (Paper): 0-7803-0646-5
DOI: 10.1109/AUTEST.1993.396294
Regular:

This paper describes the underlying concept and application of an innovative approach for developing an embedded system diagnostics capability integral to a prime system architecture. The approach... View More

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