IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the bias of Mahalanobis distance due to limited sample size effect

Proceedings of 2nd International Conference on Document Analysis and Recognition (ICDAR '93)

Author(s): Takeshita, T. ; Nozawa, S. ; Kimura, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: Tsukuba Science City, Japan
Conference Date: 20 October 1993
Page(s): 171 - 174
ISBN (Paper): 0-8186-4960-7
DOI: 10.1109/ICDAR.1993.395756
Regular:

The relationship between sample size and the bias of principal components of Mahalanobis distance is studied by computer simulation. The results shows that the bias of Mahalanobis distance in... View More

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