IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental procedure influence on total dose CMOS inverters hardness

Proceedings of 2nd European Conference Radiations and their Effects on Devices and Systems (RADECS 93)

Author(s): Mondot, E. ; David, J.P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: St. Malo, France
Conference Date: 13 September 1993
Page(s): 306 - 312
ISBN (Paper): 0-7803-1793-9
DOI: 10.1109/RADECS.1993.316532
Regular:

This issue deals with Co60 irradiation results on three commercial CMOS inverters. About ten years ago, it was proved that this type of "soft oxide" component could undergo rebound effect although... View More

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