IEEE - Institute of Electrical and Electronics Engineers, Inc. - Protons and heavy ions induced stuck bits on large capacity RAMs

Proceedings of 2nd European Conference Radiations and their Effects on Devices and Systems (RADECS 93)

Author(s): Duzellier, S. ; Falguere, D. ; Ecoffet, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: St. Malo, France
Conference Date: 13 September 1993
Page(s): 468 - 472
ISBN (Paper): 0-7803-1793-9
DOI: 10.1109/RADECS.1993.316527
Regular:

A semi-permanent imprint effect has been observed, on large capacity memories (static and dynamic), during heavy ion and proton irradiations. The experimental circumstances of stuck bits... View More

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