IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiation testing of flight lots for MARS-94 covering-semiconductor types as 4 M-BIT DRAM, 256 K-BIT SRAM, 256 K-BIT EEPROM and a 53C90 SCSI controller

Proceedings of 2nd European Conference Radiations and their Effects on Devices and Systems (RADECS 93)

Author(s): Harboe-Sorensen, R. ; Vuilleumier, P. ; Adams, L. ; Nickson, B. ; Muller, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: St. Malo, France
Conference Date: 13 September 1993
Page(s): 490 - 498
ISBN (Paper): 0-7803-1793-9
DOI: 10.1109/RADECS.1993.316525
Regular:

The MARS-94 mass memory unit (MMU) uses many new and advanced digital semiconductor components for which there is no radiation data available. This paper reports on a radiation programme covering... View More

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