IEEE - Institute of Electrical and Electronics Engineers, Inc. - A expert system for aid in material selection process

Proceedings of Engineering Management Society Conference on Managing Projects in a Borderless World

Author(s): Sharma, P.K. ; Aggarwal, A. ; Gupta, R. ; Suryanarayan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 1993
Conference Location: New Delhi, India
Conference Date: 17 December 1993
Page(s): 27 - 31
ISBN (Paper): 0-7803-1763-7
DOI: 10.1109/IEMC.1993.316509
Regular:

An expert system for aiding material selection process is proposed which, in conjunction with TOPSIS (Technique for Order Preference by Similarity to Ideal Situation), provides a very effective... View More

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